Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.

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Title: Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.
Authors: Song, Wanqing1 (AUTHOR) swqls@126.com, Yang, Xianhua1 (AUTHOR) 18059214837@163.com, Deng, Wujin2 (AUTHOR) dwj058@126.com, Cattani, Piercarlo3 (AUTHOR) cattani.1642354@studenti.uniroma1.it, Villecco, Francesco4 (AUTHOR) fvillecc@unisa.it
Source: Fractal & Fractional. Aug2024, Vol. 8 Issue 8, p485. 18p.
Database: Academic Search Ultimate
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Song%2C+Wanqing%22">Song, Wanqing</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> swqls@126.com</i><br /><searchLink fieldCode="AR" term="%22Yang%2C+Xianhua%22">Yang, Xianhua</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> 18059214837@163.com</i><br /><searchLink fieldCode="AR" term="%22Deng%2C+Wujin%22">Deng, Wujin</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> dwj058@126.com</i><br /><searchLink fieldCode="AR" term="%22Cattani%2C+Piercarlo%22">Cattani, Piercarlo</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> cattani.1642354@studenti.uniroma1.it</i><br /><searchLink fieldCode="AR" term="%22Villecco%2C+Francesco%22">Villecco, Francesco</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> fvillecc@unisa.it</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Fractal+%26+Fractional%22">Fractal & Fractional</searchLink>. Aug2024, Vol. 8 Issue 8, p485. 18p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=179380546
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/fractalfract8080485
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 18
        StartPage: 485
    Titles:
      – TitleFull: Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Song, Wanqing
      – PersonEntity:
          Name:
            NameFull: Yang, Xianhua
      – PersonEntity:
          Name:
            NameFull: Deng, Wujin
      – PersonEntity:
          Name:
            NameFull: Cattani, Piercarlo
      – PersonEntity:
          Name:
            NameFull: Villecco, Francesco
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Text: Aug2024
              Type: published
              Y: 2024
          Identifiers:
            – Type: issn-print
              Value: 25043110
          Numbering:
            – Type: volume
              Value: 8
            – Type: issue
              Value: 8
          Titles:
            – TitleFull: Fractal & Fractional
              Type: main
ResultId 1