APA (7th ed.) Citation

Liu, F., Li, M., Diao, Q., Li, Z., Shen, Z., Li, F., . . . Yang, J. (2024). Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements. Journal of Synchrotron Radiation, 31(5), 1146. https://doi.org/10.1107/S1600577524006222

Chicago Style (17th ed.) Citation

Liu, Fang, et al. "Double‐edge Scan Wavefront Metrology and Its Application in Crystal Diffraction Wavefront Measurements." Journal of Synchrotron Radiation 31, no. 5 (2024): 1146. https://doi.org/10.1107/S1600577524006222.

MLA (9th ed.) Citation

Liu, Fang, et al. "Double‐edge Scan Wavefront Metrology and Its Application in Crystal Diffraction Wavefront Measurements." Journal of Synchrotron Radiation, vol. 31, no. 5, 2024, p. 1146, https://doi.org/10.1107/S1600577524006222.