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Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.

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Bibliographic Details
Title: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
Authors: Liu, Fang1,2 (AUTHOR), Li, Ming1,2 (AUTHOR) lim@ihep.ac.cn, Diao, Qianshun1,2 (AUTHOR), Li, Zhe1 (AUTHOR), Shen, Zhibang1,2 (AUTHOR), Li, Fan3 (AUTHOR), Hong, Zhen1 (AUTHOR), Lian, Hongkai1 (AUTHOR), Yue, Shuaipeng1 (AUTHOR), Hou, Qingyan1 (AUTHOR), Zhang, Changrui1 (AUTHOR), Zhang, Dongni1,2 (AUTHOR), Li, Congcong1,2 (AUTHOR), Yang, Fugui1,2 (AUTHOR), Yang, Junliang1 (AUTHOR) yangjl@ihep.ac.cn
Source: Journal of Synchrotron Radiation. Sep2024, Vol. 31 Issue 5, p1146-1153. 8p.
Database: Academic Search Ultimate
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Description
ISSN:09090495
DOI:10.1107/S1600577524006222