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Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.

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Title: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
Authors: Liu, Fang1,2 (AUTHOR), Li, Ming1,2 (AUTHOR) lim@ihep.ac.cn, Diao, Qianshun1,2 (AUTHOR), Li, Zhe1 (AUTHOR), Shen, Zhibang1,2 (AUTHOR), Li, Fan3 (AUTHOR), Hong, Zhen1 (AUTHOR), Lian, Hongkai1 (AUTHOR), Yue, Shuaipeng1 (AUTHOR), Hou, Qingyan1 (AUTHOR), Zhang, Changrui1 (AUTHOR), Zhang, Dongni1,2 (AUTHOR), Li, Congcong1,2 (AUTHOR), Yang, Fugui1,2 (AUTHOR), Yang, Junliang1 (AUTHOR) yangjl@ihep.ac.cn
Source: Journal of Synchrotron Radiation. Sep2024, Vol. 31 Issue 5, p1146-1153. 8p.
Database: Academic Search Ultimate
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  Data: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Sep2024, Vol. 31 Issue 5, p1146-1153. 8p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=179411800
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      – Type: doi
        Value: 10.1107/S1600577524006222
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 1146
    Titles:
      – TitleFull: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
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            – D: 01
              M: 09
              Text: Sep2024
              Type: published
              Y: 2024
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              Value: 31
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            – TitleFull: Journal of Synchrotron Radiation
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