Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements. - Liu, Fang; Li, Ming; Diao, Qianshun; Li, Zhe; Shen, Zhibang; Li, Fan; Hong, Zhen; Lian, Hongkai; Yue, Shuaipeng; Hou, Qingyan; Zhang, Changrui; Zhang, Dongni; et al. (Journal of Synchrotron Radiation, 2024)