APA (7th ed.) Citation

Hasse, L., Spiralski, L., & Turczynski, J. (2005). Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena. AIP Conference Proceedings, 780(1), 725. https://doi.org/10.1063/1.2036853

Chicago Style (17th ed.) Citation

Hasse, Lech, Ludwik Spiralski, and Janusz Turczynski. "Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena." AIP Conference Proceedings 780, no. 1 (2005): 725. https://doi.org/10.1063/1.2036853.

MLA (9th ed.) Citation

Hasse, Lech, et al. "Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena." AIP Conference Proceedings, vol. 780, no. 1, 2005, p. 725, https://doi.org/10.1063/1.2036853.