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Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.

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Bibliographic Details
Title: Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.
Authors: Hasse, Lech1, Spiralski, Ludwik1,2, Turczynski, Janusz3
Source: AIP Conference Proceedings. 2005, Vol. 780 Issue 1, p725-728. 4p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 18024091
AccessLevel: 2
PubType: Conference
PubTypeId: conference
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  Data: Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.
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  Data: <searchLink fieldCode="JN" term="%22AIP+Conference+Proceedings%22">AIP Conference Proceedings</searchLink>. 2005, Vol. 780 Issue 1, p725-728. 4p.
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        Value: 10.1063/1.2036853
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 725
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      – TitleFull: Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.
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            NameFull: Hasse, Lech
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            NameFull: Spiralski, Ludwik
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              Text: 2005
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