APA (7th ed.) Citation

Oliveira, J., Reynes, J., Morel, H., Frey, P., Perrotin, O., Allirand, L., . . . Coccetti, F. (2024). Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs. Energies (19961073), 17(21), 5476. https://doi.org/10.3390/en17215476

Chicago Style (17th ed.) Citation

Oliveira, Joao, Jean-Michel Reynes, Hervé Morel, Pascal Frey, Olivier Perrotin, Laurence Allirand, Stéphane Azzopardi, Michel Piton, and Fabio Coccetti. "Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs." Energies (19961073) 17, no. 21 (2024): 5476. https://doi.org/10.3390/en17215476.

MLA (9th ed.) Citation

Oliveira, Joao, et al. "Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs." Energies (19961073), vol. 17, no. 21, 2024, p. 5476, https://doi.org/10.3390/en17215476.