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Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs.

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Title: Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs.
Authors: Oliveira, Joao1 (AUTHOR) jean-michel.reynes@irt-saintexupery.com, Reynes, Jean-Michel1 (AUTHOR) pascal.frey@irt-saintexupery.com, Morel, Hervé2 (AUTHOR) herve.morel@insa-lyon.fr, Frey, Pascal1 (AUTHOR) o.perrotin@altertechnology.fr, Perrotin, Olivier1,3 (AUTHOR) laurence.allirand@vitesco.com, Allirand, Laurence1,4 (AUTHOR) stephane.azzopardi@safrangroup.com, Azzopardi, Stéphane1,5 (AUTHOR) michel.piton@alstomgroup.com, Piton, Michel1,6 (AUTHOR) fabio.coccetti@irt-saintexupery.com, Coccetti, Fabio1 (AUTHOR)
Source: Energies (19961073). Nov2024, Vol. 17 Issue 21, p5476. 20p.
Database: Academic Search Ultimate
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              Text: Nov2024
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