Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs. - Oliveira, Joao; Reynes, Jean-Michel; Morel, Hervé; Frey, Pascal; Perrotin, Olivier; Allirand, Laurence; Azzopardi, Stéphane; Piton, Michel; Coccetti, Fabio (Energies (19961073), 2024)