APA (7th ed.) Citation

Criton, B., de la Broïse, X., & Sauvageot, J. (2025). Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs. Journal of Low Temperature Physics, 218(1), 39. https://doi.org/10.1007/s10909-024-03236-5

Chicago Style (17th ed.) Citation

Criton, Benjamin, Xavier de la Broïse, and Jean-Luc Sauvageot. "Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs." Journal of Low Temperature Physics 218, no. 1 (2025): 39. https://doi.org/10.1007/s10909-024-03236-5.

MLA (9th ed.) Citation

Criton, Benjamin, et al. "Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs." Journal of Low Temperature Physics, vol. 218, no. 1, 2025, p. 39, https://doi.org/10.1007/s10909-024-03236-5.