Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs.

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Title: Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs.
Authors: Criton, Benjamin1 (AUTHOR) benjamin.criton@cea.fr, de la Broïse, Xavier1 (AUTHOR) xavier.de-la-broise@cea.fr, Sauvageot, Jean-Luc1 (AUTHOR) jean-luc.sauvageot@cea.fr
Source: Journal of Low Temperature Physics. Jan2025, Vol. 218 Issue 1, p39-53. 15p.
Database: Academic Search Ultimate
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  Data: Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Low+Temperature+Physics%22">Journal of Low Temperature Physics</searchLink>. Jan2025, Vol. 218 Issue 1, p39-53. 15p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=182277531
RecordInfo BibRecord:
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        Value: 10.1007/s10909-024-03236-5
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      – Code: eng
        Text: English
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        PageCount: 15
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      – TitleFull: Design and First Tests From Room Temperature to 200 mK of a 16-to-1 CMOS Multiplexing ASIC for High Impedance NbSi TESs.
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            NameFull: Criton, Benjamin
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              Text: Jan2025
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              Y: 2025
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