APA (7th ed.) Citation

Kim, S., Lee, J. H., Nam, D., Park, G., Kim, M., Eom, I., . . . Kim, J. (2025). Hard X‐ray single‐shot spectrometer of PAL‐XFEL. Journal of Synchrotron Radiation, 32(1), 246. https://doi.org/10.1107/S1600577524009779

Chicago Style (17th ed.) Citation

Kim, Sangsoo, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong-jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, and Jangwoo Kim. "Hard X‐ray Single‐shot Spectrometer of PAL‐XFEL." Journal of Synchrotron Radiation 32, no. 1 (2025): 246. https://doi.org/10.1107/S1600577524009779.

MLA (9th ed.) Citation

Kim, Sangsoo, et al. "Hard X‐ray Single‐shot Spectrometer of PAL‐XFEL." Journal of Synchrotron Radiation, vol. 32, no. 1, 2025, p. 246, https://doi.org/10.1107/S1600577524009779.