APA (7th ed.) Citation

Valdoleiros, J., Akhavan-Safar, A., Maleki, P., Videira, P. F. C., Carbas, R. J. C., Marques, E. A. S., . . . da Silva, L. F. M. (2025). Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components. Surfaces (2571-9637), 8(1), 2. https://doi.org/10.3390/surfaces8010002

Chicago Style (17th ed.) Citation

Valdoleiros, João, Alireza Akhavan-Safar, Payam Maleki, Pedro F. C. Videira, Ricardo J. C. Carbas, Eduardo A. S. Marques, Bala Karunamurthy, and Lucas F. M. da Silva. "Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components." Surfaces (2571-9637) 8, no. 1 (2025): 2. https://doi.org/10.3390/surfaces8010002.

MLA (9th ed.) Citation

Valdoleiros, João, et al. "Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components." Surfaces (2571-9637), vol. 8, no. 1, 2025, p. 2, https://doi.org/10.3390/surfaces8010002.