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Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components.

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Title: Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components.
Authors: Valdoleiros, João1 (AUTHOR), Akhavan-Safar, Alireza2 (AUTHOR), Maleki, Payam2,3 (AUTHOR), Videira, Pedro F. C.1 (AUTHOR), Carbas, Ricardo J. C.2 (AUTHOR), Marques, Eduardo A. S.1,3 (AUTHOR), Karunamurthy, Bala3 (AUTHOR), da Silva, Lucas F. M.1 (AUTHOR)
Source: Surfaces (2571-9637). Mar2025, Vol. 8 Issue 1, p2. 19p.
Database: Academic Search Ultimate
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An: 184132074
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  Data: Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components.
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  Data: <searchLink fieldCode="JN" term="%22Surfaces+%282571-9637%29%22">Surfaces (2571-9637)</searchLink>. Mar2025, Vol. 8 Issue 1, p2. 19p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=184132074
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        Value: 10.3390/surfaces8010002
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        Text: English
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              Text: Mar2025
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