Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components. - Valdoleiros, João; Akhavan-Safar, Alireza; Maleki, Payam; Videira, Pedro F. C.; Carbas, Ricardo J. C.; Marques, Eduardo A. S.; Karunamurthy, Bala; da Silva, Lucas F. M. (Surfaces (2571-9637), 2025)