View in EDS HTML Full Text PDF Full Text

Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components.

Saved in:
Bibliographic Details
Title: Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components.
Authors: Valdoleiros, João1 (AUTHOR), Akhavan-Safar, Alireza2 (AUTHOR), Maleki, Payam2,3 (AUTHOR), Videira, Pedro F. C.1 (AUTHOR), Carbas, Ricardo J. C.2 (AUTHOR), Marques, Eduardo A. S.1,3 (AUTHOR), Karunamurthy, Bala3 (AUTHOR), da Silva, Lucas F. M.1 (AUTHOR)
Source: Surfaces (2571-9637). Mar2025, Vol. 8 Issue 1, p2. 19p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:25719637
DOI:10.3390/surfaces8010002