Investigation of the effects of deposition scan patterns on STS 316L thin-wall structures in directed energy deposition.
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| Title: | Investigation of the effects of deposition scan patterns on STS 316L thin-wall structures in directed energy deposition. |
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| Authors: | Han, Jisu1,2 (AUTHOR), Yang, Jeongho1 (AUTHOR), Eo, Du-Rim1 (AUTHOR), Kang, Dongseok1 (AUTHOR), Yeon, Simo1 (AUTHOR), Hong, Sukjoon3 (AUTHOR), Lee, Hyub1 (AUTHOR) leehyub@kitech.re.kr |
| Source: | International Journal of Advanced Manufacturing Technology. Apr2025, Vol. 137 Issue 7, p3727-3741. 15p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 184168268 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Investigation of the effects of deposition scan patterns on STS 316L thin-wall structures in directed energy deposition. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Han%2C+Jisu%22">Han, Jisu</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yang%2C+Jeongho%22">Yang, Jeongho</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Eo%2C+Du-Rim%22">Eo, Du-Rim</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kang%2C+Dongseok%22">Kang, Dongseok</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yeon%2C+Simo%22">Yeon, Simo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hong%2C+Sukjoon%22">Hong, Sukjoon</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lee%2C+Hyub%22">Lee, Hyub</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> leehyub@kitech.re.kr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Advanced+Manufacturing+Technology%22">International Journal of Advanced Manufacturing Technology</searchLink>. Apr2025, Vol. 137 Issue 7, p3727-3741. 15p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=184168268 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s00170-025-15382-5 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 3727 Titles: – TitleFull: Investigation of the effects of deposition scan patterns on STS 316L thin-wall structures in directed energy deposition. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Han, Jisu – PersonEntity: Name: NameFull: Yang, Jeongho – PersonEntity: Name: NameFull: Eo, Du-Rim – PersonEntity: Name: NameFull: Kang, Dongseok – PersonEntity: Name: NameFull: Yeon, Simo – PersonEntity: Name: NameFull: Hong, Sukjoon – PersonEntity: Name: NameFull: Lee, Hyub IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 02683768 Numbering: – Type: volume Value: 137 – Type: issue Value: 7 Titles: – TitleFull: International Journal of Advanced Manufacturing Technology Type: main |
| ResultId | 1 |