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Reliability Analysis of Transient Voltage Suppression Diodes Under Direct Current Switching Surge Stress.

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Bibliographic Details
Title: Reliability Analysis of Transient Voltage Suppression Diodes Under Direct Current Switching Surge Stress.
Authors: van Niekerk, Daniel1 (AUTHOR), Venter, Johan1 (AUTHOR) johanv@uj.ac.za
Source: Energies (19961073). Apr2025, Vol. 18 Issue 7, p1725. 20p.
Database: Academic Search Ultimate
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ISSN:19961073
DOI:10.3390/en18071725