APA (7th ed.) Citation

Aizpurua-Maestre, I., De Miguel, A., Lanzagorta, J. L., Carcreff, E., & Galdos, L. (2025). Single-Crystal Inspection Using an Adapted Total Focusing Method. Sensors (14248220), 25(10), 3157. https://doi.org/10.3390/s25103157

Chicago Style (17th ed.) Citation

Aizpurua-Maestre, Iratxe, Aitor De Miguel, Jose Luis Lanzagorta, Ewen Carcreff, and Lander Galdos. "Single-Crystal Inspection Using an Adapted Total Focusing Method." Sensors (14248220) 25, no. 10 (2025): 3157. https://doi.org/10.3390/s25103157.

MLA (9th ed.) Citation

Aizpurua-Maestre, Iratxe, et al. "Single-Crystal Inspection Using an Adapted Total Focusing Method." Sensors (14248220), vol. 25, no. 10, 2025, p. 3157, https://doi.org/10.3390/s25103157.