APA (7th ed.) Citation

Zink, B. R., Borders, W. A., Madhavan, A., Hoskins, B. D., & McClelland, J. (2025). Investigation of key performance metrics in TiOX/TiN based resistive random-access memory cells. Scientific Reports, 15(1), 1. https://doi.org/10.1038/s41598-025-07925-3

Chicago Style (17th ed.) Citation

Zink, Brandon R., William A. Borders, Advait Madhavan, Brian D. Hoskins, and Jabez McClelland. "Investigation of Key Performance Metrics in TiOX/TiN Based Resistive Random-access Memory Cells." Scientific Reports 15, no. 1 (2025): 1. https://doi.org/10.1038/s41598-025-07925-3.

MLA (9th ed.) Citation

Zink, Brandon R., et al. "Investigation of Key Performance Metrics in TiOX/TiN Based Resistive Random-access Memory Cells." Scientific Reports, vol. 15, no. 1, 2025, p. 1, https://doi.org/10.1038/s41598-025-07925-3.