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Investigation of key performance metrics in TiOX/TiN based resistive random-access memory cells.

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Title: Investigation of key performance metrics in TiOX/TiN based resistive random-access memory cells.
Authors: Zink, Brandon R.1 (AUTHOR) brandon.zink@nist.gov, Borders, William A.1 (AUTHOR), Madhavan, Advait1 (AUTHOR), Hoskins, Brian D.1 (AUTHOR), McClelland, Jabez1 (AUTHOR)
Source: Scientific Reports. 7/3/2025, Vol. 15 Issue 1, p1-12. 12p.
Database: Academic Search Ultimate
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  Data: Investigation of key performance metrics in TiO<subscript>X</subscript>/TiN based resistive random-access memory cells.
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  Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 7/3/2025, Vol. 15 Issue 1, p1-12. 12p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=186373802
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        Value: 10.1038/s41598-025-07925-3
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