Investigation of key performance metrics in TiOX/TiN based resistive random-access memory cells.
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| Title: | Investigation of key performance metrics in TiO |
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| Authors: | Zink, Brandon R.1 (AUTHOR) brandon.zink@nist.gov, Borders, William A.1 (AUTHOR), Madhavan, Advait1 (AUTHOR), Hoskins, Brian D.1 (AUTHOR), McClelland, Jabez1 (AUTHOR) |
| Source: | Scientific Reports. 7/3/2025, Vol. 15 Issue 1, p1-12. 12p. |
| Database: | Academic Search Ultimate |
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