APA (7th ed.) Citation

Lee, J., Kwon, J., & Lee, S. (2025). Coherence and statistical insights for low electron count regimes in transmission electron microscopy. Journal of Analytical Science & Technology, 16(1), 1. https://doi.org/10.1186/s40543-025-00503-2

Chicago Style (17th ed.) Citation

Lee, Joohyun, Ji-Hwan Kwon, and Sooheyong Lee. "Coherence and Statistical Insights for Low Electron Count Regimes in Transmission Electron Microscopy." Journal of Analytical Science & Technology 16, no. 1 (2025): 1. https://doi.org/10.1186/s40543-025-00503-2.

MLA (9th ed.) Citation

Lee, Joohyun, et al. "Coherence and Statistical Insights for Low Electron Count Regimes in Transmission Electron Microscopy." Journal of Analytical Science & Technology, vol. 16, no. 1, 2025, p. 1, https://doi.org/10.1186/s40543-025-00503-2.