Coherence and statistical insights for low electron count regimes in transmission electron microscopy.

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Title: Coherence and statistical insights for low electron count regimes in transmission electron microscopy.
Authors: Lee, Joohyun1 (AUTHOR) joohyun.lee@kriss.re.kr, Kwon, Ji-Hwan1,2 (AUTHOR) kwonjh@kriss.re.kr, Lee, Sooheyong1,2 (AUTHOR) soobydoo@kriss.re.kr
Source: Journal of Analytical Science & Technology. 7/23/2025, Vol. 16 Issue 1, p1-9. 9p.
Database: Academic Search Ultimate
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  Data: Coherence and statistical insights for low electron count regimes in transmission electron microscopy.
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  Data: <searchLink fieldCode="AR" term="%22Lee%2C+Joohyun%22">Lee, Joohyun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> joohyun.lee@kriss.re.kr</i><br /><searchLink fieldCode="AR" term="%22Kwon%2C+Ji-Hwan%22">Kwon, Ji-Hwan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> kwonjh@kriss.re.kr</i><br /><searchLink fieldCode="AR" term="%22Lee%2C+Sooheyong%22">Lee, Sooheyong</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> soobydoo@kriss.re.kr</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Analytical+Science+%26+Technology%22">Journal of Analytical Science & Technology</searchLink>. 7/23/2025, Vol. 16 Issue 1, p1-9. 9p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=186837727
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1186/s40543-025-00503-2
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      – Code: eng
        Text: English
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        PageCount: 9
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      – TitleFull: Coherence and statistical insights for low electron count regimes in transmission electron microscopy.
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            NameFull: Lee, Joohyun
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            NameFull: Kwon, Ji-Hwan
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            NameFull: Lee, Sooheyong
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            – D: 23
              M: 07
              Text: 7/23/2025
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              Y: 2025
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