Coherence and statistical insights for low electron count regimes in transmission electron microscopy.
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| Title: | Coherence and statistical insights for low electron count regimes in transmission electron microscopy. |
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| Authors: | Lee, Joohyun1 (AUTHOR) joohyun.lee@kriss.re.kr, Kwon, Ji-Hwan1,2 (AUTHOR) kwonjh@kriss.re.kr, Lee, Sooheyong1,2 (AUTHOR) soobydoo@kriss.re.kr |
| Source: | Journal of Analytical Science & Technology. 7/23/2025, Vol. 16 Issue 1, p1-9. 9p. |
| Database: | Academic Search Ultimate |
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