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Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements.

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Bibliographic Details
Title: Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements.
Authors: Suzuki, Chihiro1,2 (AUTHOR) csuzuki@nifs.ac.jp, Koike, Fumihiro3 (AUTHOR), Tamura, Naoki4 (AUTHOR), Oishi, Tetsutarou5 (AUTHOR), Nakamura, Nobuyuki6 (AUTHOR), Murakami, Izumi1,2 (AUTHOR)
Source: European Physical Journal D (EPJ D). Jun2025, Vol. 79 Issue 6, p1-10. 10p.
Database: Academic Search Ultimate
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Description
ISSN:14346060
DOI:10.1140/epjd/s10053-025-01026-6