APA (7th ed.) Citation

Imashuku, S., Ohnishi, T., & Kawai, J. (2025). Portable X‐Ray Reflectometer for Thickness and Density Determination of Mono‐ and Multi‐Layer Thin Films. XRS: X-ray Spectrometry, 54(5), 626. https://doi.org/10.1002/xrs.3499

Chicago Style (17th ed.) Citation

Imashuku, Susumu, Tsunemasa Ohnishi, and Jun Kawai. "Portable X‐Ray Reflectometer for Thickness and Density Determination of Mono‐ and Multi‐Layer Thin Films." XRS: X-ray Spectrometry 54, no. 5 (2025): 626. https://doi.org/10.1002/xrs.3499.

MLA (9th ed.) Citation

Imashuku, Susumu, et al. "Portable X‐Ray Reflectometer for Thickness and Density Determination of Mono‐ and Multi‐Layer Thin Films." XRS: X-ray Spectrometry, vol. 54, no. 5, 2025, p. 626, https://doi.org/10.1002/xrs.3499.