Portable X‐Ray Reflectometer for Thickness and Density Determination of Mono‐ and Multi‐Layer Thin Films.
Saved in:
| Title: | Portable X‐Ray Reflectometer for Thickness and Density Determination of Mono‐ and Multi‐Layer Thin Films. |
|---|---|
| Authors: | Imashuku, Susumu1 (AUTHOR) suimashuku@mat.shimane‐u.ac.jp, Ohnishi, Tsunemasa2 (AUTHOR), Kawai, Jun2 (AUTHOR) |
| Source: | XRS: X-ray Spectrometry. Sep/Oct2025, Vol. 54 Issue 5, p626-631. 6p. |
| Database: | Academic Search Ultimate |
| ISSN: | 00498246 |
|---|---|
| DOI: | 10.1002/xrs.3499 |
