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Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images.

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Bibliographic Details
Title:	Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images.
Authors:	Brunet, Melanie A.¹ (AUTHOR), Gorman, Brittney L.² (AUTHOR), Kraft, Mary L.^1,2 (AUTHOR) mlkraft@illinois.edu
Source:	Biomolecules (2218-273X). Sep2025, Vol. 15 Issue 9, p1237. 14p.
Database:	Academic Search Ultimate
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Description
ISSN:	2218273X
DOI:	10.3390/biom15091237