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W/Si Multilayer Mirrors for Soft X-Ray Wavelengths < 2.4 nm.

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Bibliographic Details
Title: W/Si Multilayer Mirrors for Soft X-Ray Wavelengths < 2.4 nm.
Authors: Sevriukov, Denys1,2 (AUTHOR) denys.sevriukov@iof.fraunhofer.de, Yulin, Sergiy1,2 (AUTHOR), Schröder, Sven1 (AUTHOR), Tünnermann, Andreas1,2 (AUTHOR)
Source: Surfaces (2571-9637). Sep2025, Vol. 8 Issue 3, p65. 8p.
Database: Academic Search Ultimate
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ISSN:25719637
DOI:10.3390/surfaces8030065