Kinstler, A. D., Neumann, R., Taylor, A. A., Besendörfer, S., Meissner, E., Weingärtner, R., . . . Schulze, J. (2025). Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes. Scientific Reports, 15(1), 1. https://doi.org/10.1038/s41598-025-25338-0
Chicago Style (17th ed.) CitationKinstler, Alexander D., et al. "Direct Investigation of Localized Leakage Currents in GaN-on-sapphire Pn-diodes." Scientific Reports 15, no. 1 (2025): 1. https://doi.org/10.1038/s41598-025-25338-0.
MLA (9th ed.) CitationKinstler, Alexander D., et al. "Direct Investigation of Localized Leakage Currents in GaN-on-sapphire Pn-diodes." Scientific Reports, vol. 15, no. 1, 2025, p. 1, https://doi.org/10.1038/s41598-025-25338-0.
Warning: These citations may not always be 100% accurate.