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Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes.

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Bibliographic Details
Title: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes.
Authors: Kinstler, Alexander D.1,2 (AUTHOR) Alexander.Kinstler@infineon.com, Neumann, Richard2 (AUTHOR), Taylor, Aidan Arthur3 (AUTHOR), Besendörfer, Sven4 (AUTHOR), Meissner, Elke1,4 (AUTHOR), Weingärtner, Roland4 (AUTHOR), Brunner, Frank5 (AUTHOR), Brusaterra, Enrico5 (AUTHOR), Bahat Treidel, Eldad5 (AUTHOR), Schulze, Jörg1,4 (AUTHOR)
Source: Scientific Reports. 11/12/2025, Vol. 15 Issue 1, p1-12. 12p.
Database: Academic Search Ultimate
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ISSN:20452322
DOI:10.1038/s41598-025-25338-0