APA (7th ed.) Citation

Sun, H., Guo, S., Pan, X., Shen, Q., Xu, Y., Ma, J., & Qu, Z. (2025). MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. Sensors (14248220), 25(22), 7049. https://doi.org/10.3390/s25227049

Chicago Style (17th ed.) Citation

Sun, Hongbin, Shijun Guo, Xin Pan, Qiuchen Shen, Yaqi Xu, Jianchuan Ma, and Zhanpeng Qu. "MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV." Sensors (14248220) 25, no. 22 (2025): 7049. https://doi.org/10.3390/s25227049.

MLA (9th ed.) Citation

Sun, Hongbin, et al. "MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV." Sensors (14248220), vol. 25, no. 22, 2025, p. 7049, https://doi.org/10.3390/s25227049.