MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV.

Saved in:
Bibliographic Details
Title: MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV.
Authors: Sun, Hongbin1 (AUTHOR) dq_shb@ccit.edu.cn, Guo, Shijun1,2 (AUTHOR), Pan, Xin2 (AUTHOR), Shen, Qiuchen1 (AUTHOR), Xu, Yaqi1 (AUTHOR), Ma, Jianchuan1 (AUTHOR), Qu, Zhanpeng1 (AUTHOR)
Source: Sensors (14248220). Nov2025, Vol. 25 Issue 22, p7049. 24p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: asn
DbLabel: Academic Search Ultimate
An: 189676534
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Sun%2C+Hongbin%22">Sun, Hongbin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> dq_shb@ccit.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Guo%2C+Shijun%22">Guo, Shijun</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pan%2C+Xin%22">Pan, Xin</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shen%2C+Qiuchen%22">Shen, Qiuchen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Yaqi%22">Xu, Yaqi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ma%2C+Jianchuan%22">Ma, Jianchuan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Qu%2C+Zhanpeng%22">Qu, Zhanpeng</searchLink><relatesTo>1</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Nov2025, Vol. 25 Issue 22, p7049. 24p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=189676534
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/s25227049
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 24
        StartPage: 7049
    Titles:
      – TitleFull: MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Sun, Hongbin
      – PersonEntity:
          Name:
            NameFull: Guo, Shijun
      – PersonEntity:
          Name:
            NameFull: Pan, Xin
      – PersonEntity:
          Name:
            NameFull: Shen, Qiuchen
      – PersonEntity:
          Name:
            NameFull: Xu, Yaqi
      – PersonEntity:
          Name:
            NameFull: Ma, Jianchuan
      – PersonEntity:
          Name:
            NameFull: Qu, Zhanpeng
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 11
              Text: Nov2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 14248220
          Numbering:
            – Type: volume
              Value: 25
            – Type: issue
              Value: 22
          Titles:
            – TitleFull: Sensors (14248220)
              Type: main
ResultId 1