MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV.
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| Title: | MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. |
|---|---|
| Authors: | Sun, Hongbin1 (AUTHOR) dq_shb@ccit.edu.cn, Guo, Shijun1,2 (AUTHOR), Pan, Xin2 (AUTHOR), Shen, Qiuchen1 (AUTHOR), Xu, Yaqi1 (AUTHOR), Ma, Jianchuan1 (AUTHOR), Qu, Zhanpeng1 (AUTHOR) |
| Source: | Sensors (14248220). Nov2025, Vol. 25 Issue 22, p7049. 24p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 189676534 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Sun%2C+Hongbin%22">Sun, Hongbin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> dq_shb@ccit.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Guo%2C+Shijun%22">Guo, Shijun</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pan%2C+Xin%22">Pan, Xin</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shen%2C+Qiuchen%22">Shen, Qiuchen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Yaqi%22">Xu, Yaqi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ma%2C+Jianchuan%22">Ma, Jianchuan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Qu%2C+Zhanpeng%22">Qu, Zhanpeng</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Nov2025, Vol. 25 Issue 22, p7049. 24p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=189676534 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/s25227049 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 24 StartPage: 7049 Titles: – TitleFull: MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sun, Hongbin – PersonEntity: Name: NameFull: Guo, Shijun – PersonEntity: Name: NameFull: Pan, Xin – PersonEntity: Name: NameFull: Shen, Qiuchen – PersonEntity: Name: NameFull: Xu, Yaqi – PersonEntity: Name: NameFull: Ma, Jianchuan – PersonEntity: Name: NameFull: Qu, Zhanpeng IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 11 Text: Nov2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 14248220 Numbering: – Type: volume Value: 25 – Type: issue Value: 22 Titles: – TitleFull: Sensors (14248220) Type: main |
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