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Software Reliability Growth Model Combining Testing Effort Function and Burr-Type Fault Detection Rate.

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Title: Software Reliability Growth Model Combining Testing Effort Function and Burr-Type Fault Detection Rate.
Authors: Qiao, Yixin1 (AUTHOR), Han, Qiang1 (AUTHOR) hanqiang@nmu.edu.cn, Han, Sheng1 (AUTHOR), Shi, Zhichao1 (AUTHOR), Xue, Kehan1 (AUTHOR)
Source: Mathematics (2227-7390). Nov2025, Vol. 13 Issue 22, p3633. 22p.
Database: Academic Search Ultimate
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  Data: Software Reliability Growth Model Combining Testing Effort Function and Burr-Type Fault Detection Rate.
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  Data: <searchLink fieldCode="AR" term="%22Qiao%2C+Yixin%22">Qiao, Yixin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Han%2C+Qiang%22">Han, Qiang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hanqiang@nmu.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Han%2C+Sheng%22">Han, Sheng</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shi%2C+Zhichao%22">Shi, Zhichao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xue%2C+Kehan%22">Xue, Kehan</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Mathematics+%282227-7390%29%22">Mathematics (2227-7390)</searchLink>. Nov2025, Vol. 13 Issue 22, p3633. 22p.
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        Value: 10.3390/math13223633
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              Text: Nov2025
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