Quintanilla, L., & Pinacho, R. (1999). Electrical characterization of a He ion implantation-induced deep level existing in p...n InP.. Journal of Applied Physics, 85(11), 7978. https://doi.org/10.1063/1.369388
Chicago Style (17th ed.) CitationQuintanilla, L., and R. Pinacho. "Electrical Characterization of a He Ion Implantation-induced Deep Level Existing in P...n InP.." Journal of Applied Physics 85, no. 11 (1999): 7978. https://doi.org/10.1063/1.369388.
MLA (9th ed.) CitationQuintanilla, L., and R. Pinacho. "Electrical Characterization of a He Ion Implantation-induced Deep Level Existing in P...n InP.." Journal of Applied Physics, vol. 85, no. 11, 1999, p. 7978, https://doi.org/10.1063/1.369388.
Warning: These citations may not always be 100% accurate.