Thermally stable Bi2Te3/WSe2 Van Der Waals contacts for pMOSFETs application.
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| Title: | Thermally stable Bi |
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| Authors: | Chang, Wen Hsin1 (AUTHOR) wh-chang@aist.go.jp, Hatayama, Shogo1 (AUTHOR), Saito, Yuta1,2,3 (AUTHOR) yuta.saito.e5@tohoku.ac.jp, Okada, Naoya1 (AUTHOR), Endo, Takahiko4 (AUTHOR), Miyata, Yasumitsu4 (AUTHOR), Irisawa, Toshifumi1 (AUTHOR) |
| Source: | Scientific Reports. 11/19/2024, Vol. 14 Issue 1, p1-9. 9p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 190277439 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Thermally stable Bi<subscript>2</subscript>Te<subscript>3</subscript>/WSe<subscript>2</subscript> Van Der Waals contacts for pMOSFETs application. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Chang%2C+Wen+Hsin%22">Chang, Wen Hsin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> wh-chang@aist.go.jp</i><br /><searchLink fieldCode="AR" term="%22Hatayama%2C+Shogo%22">Hatayama, Shogo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Saito%2C+Yuta%22">Saito, Yuta</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<i> yuta.saito.e5@tohoku.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Okada%2C+Naoya%22">Okada, Naoya</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Endo%2C+Takahiko%22">Endo, Takahiko</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Miyata%2C+Yasumitsu%22">Miyata, Yasumitsu</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Irisawa%2C+Toshifumi%22">Irisawa, Toshifumi</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 11/19/2024, Vol. 14 Issue 1, p1-9. 9p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=190277439 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1038/s41598-024-79750-z Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 1 Titles: – TitleFull: Thermally stable Bi2Te3/WSe2 Van Der Waals contacts for pMOSFETs application. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chang, Wen Hsin – PersonEntity: Name: NameFull: Hatayama, Shogo – PersonEntity: Name: NameFull: Saito, Yuta – PersonEntity: Name: NameFull: Okada, Naoya – PersonEntity: Name: NameFull: Endo, Takahiko – PersonEntity: Name: NameFull: Miyata, Yasumitsu – PersonEntity: Name: NameFull: Irisawa, Toshifumi IsPartOfRelationships: – BibEntity: Dates: – D: 19 M: 11 Text: 11/19/2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 20452322 Numbering: – Type: volume Value: 14 – Type: issue Value: 1 Titles: – TitleFull: Scientific Reports Type: main |
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