APA (7th ed.) Citation

Han, C., Kwon, Y., Jeung, J., Lee, T., & Kim, J. (2025). SEMOS: A scanning electron microscope optical simulator for instrumental performance optimization. Journal of Analytical Science & Technology, 16(1), 1. https://doi.org/10.1186/s40543-025-00518-9

Chicago Style (17th ed.) Citation

Han, Cheolsu, Yong-Eun Kwon, Jong-Man Jeung, Tae-Yeoung Lee, and Jin-Gyu Kim. "SEMOS: A Scanning Electron Microscope Optical Simulator for Instrumental Performance Optimization." Journal of Analytical Science & Technology 16, no. 1 (2025): 1. https://doi.org/10.1186/s40543-025-00518-9.

MLA (9th ed.) Citation

Han, Cheolsu, et al. "SEMOS: A Scanning Electron Microscope Optical Simulator for Instrumental Performance Optimization." Journal of Analytical Science & Technology, vol. 16, no. 1, 2025, p. 1, https://doi.org/10.1186/s40543-025-00518-9.