Zheng, B., & Yang, Y. (2025). AE-YOLO: Research and Application of the YOLOv11-Based Lightweight Improved Model in Photovoltaic Panel Surface Intelligent Defect Detection. Materials (1996-1944), 18(23), 5404. https://doi.org/10.3390/ma18235404
Chicago Style (17th ed.) CitationZheng, Bin, and Yunjin Yang. "AE-YOLO: Research and Application of the YOLOv11-Based Lightweight Improved Model in Photovoltaic Panel Surface Intelligent Defect Detection." Materials (1996-1944) 18, no. 23 (2025): 5404. https://doi.org/10.3390/ma18235404.
MLA (9th ed.) CitationZheng, Bin, and Yunjin Yang. "AE-YOLO: Research and Application of the YOLOv11-Based Lightweight Improved Model in Photovoltaic Panel Surface Intelligent Defect Detection." Materials (1996-1944), vol. 18, no. 23, 2025, p. 5404, https://doi.org/10.3390/ma18235404.