Physics-based unified analytical model capturing the transport and trapping mechanisms of electrons and holes in GaN-based heterostructures under a high substrate bias.

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Bibliographic Details
Title: Physics-based unified analytical model capturing the transport and trapping mechanisms of electrons and holes in GaN-based heterostructures under a high substrate bias.
Authors: Jeyakumar, Ranie S.1 (AUTHOR), Ganguly, Swaroop1 (AUTHOR), Saha, Dipankar1 (AUTHOR) dipankarsaha@iitb.ac.in
Source: APL Electronic Devices. Dec2025, Vol. 1 Issue 4, p1-11. 11p.
Database: Academic Search Ultimate
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ISSN:29958423
DOI:10.1063/5.0300125