Methodological insights into the dip‐and‐pull X‐ray photoelectron spectroscopy technique: analysing electrochemical interfaces under in situ/operando conditions.

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Title: Methodological insights into the dip‐and‐pull X‐ray photoelectron spectroscopy technique: analysing electrochemical interfaces under in situ/operando conditions.
Authors: Rotonnelli, Benjamin1 (AUTHOR), Brige, Amandine1,2 (AUTHOR), Oshchepkov, Alexandr G.1 (AUTHOR), Gallet, Jean-Jacques2 (AUTHOR), Bournel, Fabrice2 (AUTHOR), Bonnefont, Antoine3 (AUTHOR), Yaroslavtsev, Alexander4 (AUTHOR), Shavorskiy, Andrey4 (AUTHOR), Temperton, Robert4 (AUTHOR), Savinova, Elena R.1 (AUTHOR) elena.savinova@unistra.fr, Asset, Tristan1 (AUTHOR) t.asset@unistra.fr
Source: Journal of Synchrotron Radiation. Jan2026, Vol. 33 Issue 1, p130-141. 12p.
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        Value: 10.1107/S1600577525008811
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        Text: English
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      – TitleFull: Methodological insights into the dip‐and‐pull X‐ray photoelectron spectroscopy technique: analysing electrochemical interfaces under in situ/operando conditions.
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            – D: 01
              M: 01
              Text: Jan2026
              Type: published
              Y: 2026
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