APA (7th ed.) Citation

Bian, H., Shen, Y., Peng, H., Wen, Y., You, M., Liu, J., & Lin, Z. (2026). Impact and mechanisms of film thickness on sensitivity and magnetoresistance of CrOxNy thin-film cryogenic temperature sensor. Journal of Applied Physics, 139(3), 1. https://doi.org/10.1063/5.0292836

Chicago Style (17th ed.) Citation

Bian, Hao, Yudong Shen, Huiling Peng, Yuntong Wen, Minmin You, Jingquan Liu, and Zude Lin. "Impact and Mechanisms of Film Thickness on Sensitivity and Magnetoresistance of CrOxNy Thin-film Cryogenic Temperature Sensor." Journal of Applied Physics 139, no. 3 (2026): 1. https://doi.org/10.1063/5.0292836.

MLA (9th ed.) Citation

Bian, Hao, et al. "Impact and Mechanisms of Film Thickness on Sensitivity and Magnetoresistance of CrOxNy Thin-film Cryogenic Temperature Sensor." Journal of Applied Physics, vol. 139, no. 3, 2026, p. 1, https://doi.org/10.1063/5.0292836.