APA (7th ed.) Citation

Kim, J. S., Gaggio, B., Bakhit, B., Lenzi, V., Marques, L., Fairclough, S. M., . . . MacManus‐Driscoll, J. L. (2026). Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach. Advanced Science, 13(5), 1. https://doi.org/10.1002/advs.202517314

Chicago Style (17th ed.) Citation

Kim, Ji Soo, et al. "Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach." Advanced Science 13, no. 5 (2026): 1. https://doi.org/10.1002/advs.202517314.

MLA (9th ed.) Citation

Kim, Ji Soo, et al. "Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach." Advanced Science, vol. 13, no. 5, 2026, p. 1, https://doi.org/10.1002/advs.202517314.