Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach.
Saved in:
| Title: | Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf |
|---|---|
| Authors: | Kim, Ji Soo1 (AUTHOR) jsk55@cam.ac.uk, Gaggio, Benedetta1 (AUTHOR), Bakhit, Babak1 (AUTHOR), Lenzi, Veniero2,3 (AUTHOR), Marques, Luis2,3 (AUTHOR), Fairclough, Simon M.1 (AUTHOR), Strkalj, Nives1,4 (AUTHOR), Choe, Duk‐Hyun5 (AUTHOR), Silva, José P. B.2,3 (AUTHOR) josesilva@fisica.uminho.pt, MacManus‐Driscoll, J. L.1 (AUTHOR) jld35@cam.ac.uk |
| Source: | Advanced Science. 1/27/2026, Vol. 13 Issue 5, p1-9. 9p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 21983844 |
|---|---|
| DOI: | 10.1002/advs.202517314 |