Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach.

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Title: Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach.
Authors: Kim, Ji Soo1 (AUTHOR) jsk55@cam.ac.uk, Gaggio, Benedetta1 (AUTHOR), Bakhit, Babak1 (AUTHOR), Lenzi, Veniero2,3 (AUTHOR), Marques, Luis2,3 (AUTHOR), Fairclough, Simon M.1 (AUTHOR), Strkalj, Nives1,4 (AUTHOR), Choe, Duk‐Hyun5 (AUTHOR), Silva, José P. B.2,3 (AUTHOR) josesilva@fisica.uminho.pt, MacManus‐Driscoll, J. L.1 (AUTHOR) jld35@cam.ac.uk
Source: Advanced Science. 1/27/2026, Vol. 13 Issue 5, p1-9. 9p.
Database: Academic Search Ultimate
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ISSN:21983844
DOI:10.1002/advs.202517314