APA (7th ed.) Citation

Im, J., Heo, J., Cheon, S., Kim, J., & Cho, S. O. (2026). Optically‐Coupled X‐Ray Computed Laminography System for High‐Speed Inspection of Lithium‐Ion Batteries. Advanced Science, 13(7), 1. https://doi.org/10.1002/advs.202517158

Chicago Style (17th ed.) Citation

Im, Jaeyoung, Jun Heo, Seunguk Cheon, Jichan Kim, and Sung Oh Cho. "Optically‐Coupled X‐Ray Computed Laminography System for High‐Speed Inspection of Lithium‐Ion Batteries." Advanced Science 13, no. 7 (2026): 1. https://doi.org/10.1002/advs.202517158.

MLA (9th ed.) Citation

Im, Jaeyoung, et al. "Optically‐Coupled X‐Ray Computed Laminography System for High‐Speed Inspection of Lithium‐Ion Batteries." Advanced Science, vol. 13, no. 7, 2026, p. 1, https://doi.org/10.1002/advs.202517158.