Kumar, S., Allard, B., Hologne-Carpentier, M., Clerc, G., & Auger, F. (2026). Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction. Entropy, 28(2), 234. https://doi.org/10.3390/e28020234
Chicago Style (17th ed.) CitationKumar, Sanjiv, Bruno Allard, Malorie Hologne-Carpentier, Guy Clerc, and François Auger. "Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction." Entropy 28, no. 2 (2026): 234. https://doi.org/10.3390/e28020234.
MLA (9th ed.) CitationKumar, Sanjiv, et al. "Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction." Entropy, vol. 28, no. 2, 2026, p. 234, https://doi.org/10.3390/e28020234.