Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction.

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Bibliographic Details
Title: Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction.
Authors: Kumar, Sanjiv1 (AUTHOR) sanjiv.kumar@insa-lyon.fr, Allard, Bruno1,2 (AUTHOR), Hologne-Carpentier, Malorie2,3 (AUTHOR), Clerc, Guy1 (AUTHOR), Auger, François2,3 (AUTHOR)
Source: Entropy. Feb2026, Vol. 28 Issue 2, p234. 32p.
Database: Academic Search Ultimate
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ISSN:10994300
DOI:10.3390/e28020234