Goyal, A., Kumar, R., Galluzzi, A., & Polichetti, M. (2026). Limit to Self-Field Critical Current Density in Thin-Film, Type-II Superconductors. Materials (1996-1944), 19(4), 745. https://doi.org/10.3390/ma19040745
Chicago Style (17th ed.) CitationGoyal, Amit, Rohit Kumar, Armando Galluzzi, and Massimiliano Polichetti. "Limit to Self-Field Critical Current Density in Thin-Film, Type-II Superconductors." Materials (1996-1944) 19, no. 4 (2026): 745. https://doi.org/10.3390/ma19040745.
MLA (9th ed.) CitationGoyal, Amit, et al. "Limit to Self-Field Critical Current Density in Thin-Film, Type-II Superconductors." Materials (1996-1944), vol. 19, no. 4, 2026, p. 745, https://doi.org/10.3390/ma19040745.
Warning: These citations may not always be 100% accurate.