Naito, K., Nakajima, N., & Shiki, S. (2026). Fluorescence‐line‐selective soft X‐ray absorption spectroscopy: A novel approach to element‐specific electronic structure analysis. Journal of Synchrotron Radiation, 33(2), 390. https://doi.org/10.1107/S1600577526000615
Chicago Style (17th ed.) CitationNaito, Kota, Nobuo Nakajima, and Shigetomo Shiki. "Fluorescence‐line‐selective Soft X‐ray Absorption Spectroscopy: A Novel Approach to Element‐specific Electronic Structure Analysis." Journal of Synchrotron Radiation 33, no. 2 (2026): 390. https://doi.org/10.1107/S1600577526000615.
MLA (9th ed.) CitationNaito, Kota, et al. "Fluorescence‐line‐selective Soft X‐ray Absorption Spectroscopy: A Novel Approach to Element‐specific Electronic Structure Analysis." Journal of Synchrotron Radiation, vol. 33, no. 2, 2026, p. 390, https://doi.org/10.1107/S1600577526000615.